Trade.Information

Product Name: Xi-100 Non-Contact Optical Profiler | Scanning White Light Interferometer

Product Description

The Xi-100 is designed for the researcher who is interested in getting fast, repeatable data from an instrument that is unencumbered by unnecessary levels of complication. The Xi-100 uses phase-shifting interferometric technology combined with an optical microscope to provide a non-contact 3D method of measuring the roughness of surfaces.

Xi-100 Features Include:

• Precise, high-resolution, non-contact 3D profiler
• 'Point and shoot' operation. The only instrument adjustments for capturing measurements are sample position and focus, allowing for rapid and easy imaging.
• Accurate and repeatable data on smooth or rough surfaces
• Measure smooth surfaces at the nanometer level - 0.2 nm (smooth mode) Vertical Resolution
• Full featured 3D analysis software comes standard with the Xi-100 and operates with Windows®, Intel Processor and TFT Flat Panel Monitor. Analysis package provides surface roughness, waviness, step height, algorithms, and calculation tools
• The Xi-100 can quickly and accurately measure smooth surfaces at the nanometer level. Its design makes it easy to measure a variety of sample types: opaque, transparent, smooth or rough with a non-contact interferometric method (requires minimum sample reflectivity of 2% @ 550 nm).
• XY Stage Movement of 100 x 100 nm

Related Documents:
Xi-100 Product Brochure and Specifications (PDF)
Xi-100 Software Highlights
Purchase an Xi-100

Company Details

Ambios Technology, Inc. was founded in 1996. The company is dedicated to the design and manufacture of innovative surface metrology instruments for the academic and general industrial sectors. With the number of installed instruments growing... more